California State University SCIQuest #CSULB-RFP-00000846

Focused Ion Beam Scanning Electron Microscope for CSULB

California State University, Long Beach is seeking a FIB-SEM system for nanoscale materials research at its Hung Family College of Engineering. - Government buyer: California State University, Long Beach (CSULB), Hung Family College of Engineering. - Procurement: One Focused Ion Beam Scanning Electron Microscope (FIB-SEM); no part number or specific model is identified. - Required capabilities: Fully digital, ultra-high-resolution field-emission SEM with focused ion beam technology for nanometer-scale characterization, 2D/3D analysis, thin-sample preparation, and in-situ materials testing. - OEMs and vendors: No manufacturer, brand, or vendor is named in the available notice. - Notable requirements: The system must support high-resolution imaging and analysis as well as sample preparation and testing within the instrument.

Description

This Request for Proposals seeks proposals from qualified firms to provide the CSULB Hung Family College of Engineering with a Focused Ion Beam Scanning Electron Microscope (FIB SEM). The FIB SEM is described as a fully digital, ultra-high-resolution field-emission scanning electron microscope equipped with focused ion beam technology. It supports nanometer-scale characterization and analysis in 2D and 3D, thin sample preparation, and in-situ materials testing. Responses are due November 13, 2026, at 2:00 PM PST and must be submitted through the procurement portal.

View original listing