# California State University SCIQuest #CSULB-RFP-00000846

Focused Ion Beam Scanning Electron Microscope for CSULB

**Posted:** October 10, 2026
**Respond By:** November 13, 2026
**Identifier:** CSULB-RFP-00000846
**NAICS:** 334516

California State University, Long Beach is seeking a FIB-SEM system for nanoscale materials research at its Hung Family College of Engineering.
- Government buyer: California State University, Long Beach (CSULB), Hung Family College of Engineering.
- Procurement: One Focused Ion Beam Scanning Electron Microscope (FIB-SEM); no part number or specific model is identified.
- Required capabilities: Fully digital, ultra-high-resolution field-emission SEM with focused ion beam technology for nanometer-scale characterization, 2D/3D analysis, thin-sample preparation, and in-situ materials testing.
- OEMs and vendors: No manufacturer, brand, or vendor is named in the available notice.
- Notable requirements: The system must support high-resolution imaging and analysis as well as sample preparation and testing within the instrument.

### Description

This Request for Proposals seeks proposals from qualified firms to provide the CSULB Hung Family College of Engineering with a Focused Ion Beam Scanning Electron Microscope (FIB SEM). The FIB SEM is described as a fully digital, ultra-high-resolution field-emission scanning electron microscope equipped with focused ion beam technology. It supports nanometer-scale characterization and analysis in 2D and 3D, thin sample preparation, and in-situ materials testing. Responses are due November 13, 2026, at 2:00 PM PST and must be submitted through the procurement portal.

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