Opportunity

SAM #NB573063-27-0001

NIST seeks a replacement cesium source head for its ToF-SIMS instrument

Buyer

DEPT OF COMMERCE NIST

Posted

October 28, 2026

Respond By

November 07, 2026

Identifier

NB573063-27-0001

NAICS

423490

NIST is seeking a replacement cesium source head to restore its non-operational time-of-flight secondary ion mass spectrometry instrument. - Government buyer: U.S. Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division. - Requested item: One replacement cesium source head for a ToF-SIMS instrument; no part number or quantity is specified. - Named supplier/OEM: ION-TOF USA, Inc. NIST intends to procure from this company, which states it is the only authorized and capable source for service and spare parts for IONTOF surface-analysis equipment, including ToF-SIMS IV instruments. - Notable requirement: The replacement must support NIST’s existing ToF-SIMS instrument. No compatible model or technical specifications are provided. - The notice invites capable interested parties to provide information for consideration; it is not a request for competitive quotations.

Description

FBO ANNOUNCEMENT: PRESOLICITATION NOTICE, NOTICE OF INTENT

ACTION CODE: Presolicitation Notice

SUBJECT: Sole source – Replacement Cesium Source Head for a Secondary Ion Mass Spectrometry Instrument

RESPONSE DATE: 11/07/26

DESCRIPTION:

The National Institute of Standards and Technology (NIST) relies on a time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument. Currently, the Cesium Source Head is non-functional and requires urgent replacement to restore operation.

The National Institute of Standards and Technology (NIST) intends to negotiate on a sole source basis, under the authority of FAR Part 12.102(b) with ION-TOF USA, Inc located in Chestnut Ridge, New York, for this replacement equipment.

Sole Source justification is based on the following:

Market research has shown that ION-TOF is the sole source for replacement equipment for this NIST owned Secondary Ion Mass Spectrometry Instrument instrument. ION-TOF has stated in writing stated that: “ION-TOF USA, Inc. is the only company authorized and capable of offering service and spare parts for the IONTOF range of surface analysis equipment including the TOF-SIMS IV instruments.”

NAICS code for this requirement will be 334516– Analytical Laboratory Instrument Manufacturing with a small business size of 1000 employees.

No solicitation package will be issued. This notice of intent is not a request for competitive quotations; however, interested parties who regard themselves as capable of fulfilling these requirements are invited to submit responses to the Government for consideration. Responses received by 1:00AM EST on 11/07/26 will be considered by the Government.

A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement.

Inquiry POCs

Erik.Fycklund@nist.gov  Primary

Donald.Graham@nist.gov  Secondary

National Institutes of Standards and Technologies NIST Acquisition Management Division (AMD)

100 Bureau Dr. Mail Stop 1640

Gaithersburg, MD. 20899-1640

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