Quebec SEAO #20175446

Automated Probe-Testing Platform for 200 mm Semiconductor Wafers

C2MI is seeking an automated platform to test 200 mm semiconductor wafers used in qubit fabrication.

Description

C2MI is seeking a one-time purchase of an automated probe-testing platform for 200 mm semiconductor wafers. The platform will primarily monitor and characterize qubit fabrication processes and must support automated cassette-to-cassette wafer handling, wafer mapping, and precise positioning of contact probes. It will be installed in a new ISO 5 quantum fabrication cleanroom and must be suitable for sensitive semiconductor and quantum-device manufacturing. The tender documents are available through SEAO, and submissions are due October 20, 2026 at 18:30 UTC.

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