SAM #1333ND26QNB030476

NIST Solicitation for Oxide, Nitride, and Epitaxial SiGe Wafer Deposition and Metrology Services

This opportunity involves the procurement of advanced wafer deposition and metrology services for the National Institute of Standards and Technology (NIST), under the Department of Commerce. - Government Buyer: - Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division - Products/Services Requested: - Oxide or nitride deposition services (3 separate line items, 10 units each) - Epitaxial silicon-germanium (SiGe) deposition services (3 separate line items, 10 units each) - Additional metrology services associated with each deposition line item (1 unit per deposition line item) - Quantities: - 10 units per deposition service (total: 30 oxide/nitride, 30 SiGe) - 1 unit per metrology service (total: 6 metrology) - Unique/Notable Requirements: - Some depositions require an Au (gold) or equivalent cap - Each deposition service is paired with a dedicated metrology service - The procurement is eligible under the Women-Owned Business Program - Optional period of performance extends for one year - OEMs and Vendors: - No specific OEMs or vendors are named in the solicitation or attachments - All technical and product details are specified in the solicitation attachment

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