Mississippi Procurement Portal #3150006943

Procurement of Ionoptika GCIB 10S Gas Cluster Ion Beam System for Advanced Surface Analysis

The University of Mississippi's Department of Chemistry & Biochemistry is seeking to acquire a Gas Cluster Ion Beam (Argon Source) System for advanced surface analysis in its laboratory. - Government Buyer: - University of Mississippi, Department of Chemistry & Biochemistry, Procurement Services - Contact: Jeff Wells, Procurement Manager - OEM and Vendor: - Ionoptika (sole manufacturer and distributor) - Products Requested: - Ionoptika GCIB 10S Gas Cluster Ion Beam System (Argon Source) - Part Number: Ionoptika GCIB 10S - Quantity: 1 - Description: High-performance gas cluster ion beam system for rapid, low-damage sputtering and superior surface analysis; stand-alone argon source; integrates with custom laboratory equipment - Unique Requirements: - Must provide rapid, low-damage sputtering for surface analysis - Capable of controlled removal of ultra-thin films over a 7 x 7 mm area - Integrates with custom laboratory instrumentation - Real-time cluster measurement and sample current imaging - Compatible with high-vacuum instruments and software - Only Ionoptika can supply a stand-alone argon cluster source compatible with the university's custom equipment - Estimated Contract Value: $121,740 (below market cost for custom ion sources)

Description

This is a sole source procurement for a Gas Cluster Ion Beam (Argon Source) System needed by the University of Mississippi's Department of Chemistry & Biochemistry. The system is required for high-performance, low-damage sputtering enabling superior surface analysis and must be compatible with existing custom laboratory equipment. Ionoptika is the sole manufacturer and direct distributor of this proprietary instrument. The response deadline for this procurement is August 4, 2026, at 10:00 AM.

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