SAM #1333ND26QNB640352

NIST Solicitation for Custom Micropillar Array Fabrication

The Department of Commerce, National Institute of Standards and Technology (NIST), is seeking small business vendors to fabricate custom micropillar arrays for advanced materials research. - Government Buyer: - Department of Commerce (DOC) - National Institute of Standards and Technology (NIST) - Acquisition Management Division - Material Measurement Laboratory (MML) - Products/Services Requested: - Fabrication of custom micropillar arrays - Arrays must be pre-sharpened - Direct compatibility with modern atom probe instruments is required - Intended for use as reference materials in measuring phosphorus concentration in silicon using Atom Probe Tomography (APT) and other techniques - OEMs and Vendors: - No specific OEMs or vendors are named in the solicitation - Unique/Notable Requirements: - Arrays must be fabricated to precise specifications for compatibility with advanced measurement equipment - Procurement is set aside for small businesses under NAICS code 541713 (Research and Development in Nanotechnology) - No part numbers or specific quantities are provided

Description

SOLICITATION 1333ND26QNB640352

Fabrication of Custom Micropillar Arrays

This is a solicitation for commercial supplies prepared in accordance with the format in RFO Subpart 12.2, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotations are being requested, and a separate written solicitation document will not be issued.

This solicitation is a Request for Quotation (RFQ).

The associated North American Industrial Classification System (NAICS) code for this procurement is 541713 – Research and Development in Nanotechnology with a Small Business Size standard of 1,000 employees. This requirement will be competed as a Total Small Business Set-Aside.

The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is looking to develop reference materials for measuring the phosphorus concentration in silicon using Atom Probe Tomography (APT) and other complementary measurement techniques. These materials will be most useful to analysts if provided as pre-sharpened micropillar arrays that are directly compatible with modern atom probe instruments.

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