Opportunity

CanadaBuys #Q-2026-020-WT

Queen's University Solicits Proposals for Focused-Ion Beam/Scanning Electron Microscope (FIB-SEM) System

Posted

June 30, 2026

Respond By

June 30, 2026

Identifier

Q-2026-020-WT

NAICS

423490

Queen's University in Kingston, Ontario is seeking proposals for the purchase of a Focused-Ion Beam/Scanning Electron Microscope (FIB-SEM) System. - The FIB-SEM system will be used for: - Preparing ultra-thin foils for transmission electron microscopy (TEM) - Final stage thinning at cryogenic temperatures - Ambient condition milling for small-scale mechanical testing (e.g., cantilever beams, micropillars) - 3D microstructural analysis - No specific OEMs, brands, or part numbers are identified in the solicitation - The procurement will be conducted through competitive selective tendering - The contract period is estimated at 24 months - The opportunity is governed by relevant trade agreements, including the Canada-European Union Comprehensive Economic and Trade Agreement (CETA)

Description

This solicitation is for the procurement of a Focused-Ion Beam/Scanning Electron Microscope (FIB-SEM) System. The contract duration is estimated to be 60 months. The procurement method is competitive open bidding, and no trade agreements apply to this solicitation. The contracting organization is Queen's University in Ontario, Canada.

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