Quebec SEAO #20155729

Procurement of X-ray Tomography System for Microelectronics Failure Analysis

C2MI is initiating a procurement for an advanced X-ray tomography system to support microelectronics failure analysis. - Government Buyer: - Centre de Collaboration MiQro Innovation (C2MI) - Products/Services Requested: - X-ray tomography system for failure analysis of microelectronic products - System must be capable of evaluating solder connections, including bump sizes as small as 5-30 micrometers - Delivery required to C2MI facility in Bromont, Quebec - Unique/Notable Requirements: - High-resolution imaging for micro-scale features (5-30 micrometers) - One-time purchase; supplier responsible for delivery - No specific OEMs, part numbers, or quantities provided - Agency reserves the right to reject all bids; no bid or performance guarantees - OEMs and Vendors: - No specific OEMs or vendors named in the solicitation

Description

This solicitation is for the acquisition of an X-ray tomography system intended for failure analysis of microelectronic products. The equipment will be used to evaluate solder connections with bump sizes potentially as small as 5-30 micrometers. The procurement is a one-time purchase with no guarantees of bid or performance. The supplier is responsible for proper delivery of the system. The procuring agency reserves the right to reject all bids.

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