SAM #1333ND26QNB030236

NIST Solicitation for Custom Diffractometry and Fourier Ptychography Endstation with Optional Installation and Training

NIST's Nanoscale Device Characterization Division is seeking quotations for a custom Diffractometry and Fourier Ptychography Endstation to support advanced semiconductor metrology research. - Government Buyer: - National Institute of Standards and Technology (NIST), Nanoscale Device Characterization Division (NDCD) - Products and Services Requested: - Custom Diffractometry and Fourier Ptychography Endstation (1 unit) - Includes custom vacuum chamber body, high vacuum capability, sample stage with wafer chuck, optical/camera stage, full in-vacuum EUV camera, large o-ring gasket and bolts, adjustable base, and all control electronics, cables, and software - Must meet detailed technical specifications for vacuum compatibility, motion precision, camera resolution, and cooling - Requires CAD design deliverables and non-destructive 3D measurement capability for nanoscale features using EUV light - Optional Installation and Training (1 unit) - Onsite installation, setup, demonstration, and training for up to two users - Training covers system operation, maintenance, data administration, and troubleshooting - Shipping and other transportation-related charges (Not-to-Exceed amount) - Unique/Notable Requirements: - No prototypes or refurbished equipment accepted; only new, custom-built systems - Delivery of the endstation required within 120 days after order - Installation and training, if selected, must occur within 2 weeks after delivery - Deliverables include initial and final design reviews, with specific timelines - Procurement is unrestricted under NAICS code 334519 - OEMs and Vendors: - No specific OEMs or vendors are named; open to qualified manufacturers of custom scientific instrumentation

Description

See attachments for solicitation details.

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