SAM #AMD-SSN-26-01461

NIST Seeks Electrical Performance Monitoring System for Semiconductor Reliability Testing

The National Institute of Standards and Technology (NIST) Engineering Laboratory is seeking to procure a specialized Electrical Performance Monitoring System to support advanced semiconductor reliability testing for the CHIPS Metrology program. - Government Buyer: - National Institute of Standards and Technology (NIST) - Engineering Laboratory, Infrastructure and Materials Group - Products/Services Requested: - One modular DC current-stress/electrical analyzer system - Minimum 8 independently programmable DC source output channels - Capable of continuous, long-duration operation - Applied current range: 0 A to +3 A per channel - Voltage compliance: 50 V; Output power: 100 W per channel - Four-wire remote sense capability - Integration with external measurement systems - Hardware isolation and protection features - Multiuser software for automated test setup, control, data logging, and export - Includes all required mainframes, source modules, power cords, control interfaces, factory calibration, software licenses, and documentation - Unique/Notable Requirements: - System must be suitable for rack or bench operation - Must support in-situ resistance measurements during multi-stress accelerated aging tests of semiconductor device components - Delivery required within 5 months of order; minimum 12-month warranty after acceptance - No specific OEMs or part numbers are named in the requirements - All technical and procurement details are provided in the Statement of Work attachment

Description

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