Opportunity

SAM #H7TM01

Procurement of Multi-purpose X-ray Diffraction (XRD) System for Aerospace Materials Analysis

Buyer

AFSC PZIMB

Posted

June 05, 2026

Respond By

July 05, 2026

Identifier

H7TM01

NAICS

334516, 334517

This opportunity is for the procurement of a Multi-purpose X-ray Diffraction (XRD) System for the Oklahoma City Air Logistics Center (OC-ALC) at Tinker Air Force Base, under the United States Air Force. - Government Buyer: - United States Air Force - Oklahoma City Air Logistics Center (OC-ALC) - Analytical Chemistry Section, Tinker Air Force Base - Products Requested: - Multipurpose X-ray Diffraction (XRD) System (part number H7TM01) - Includes multiple X-ray tubes: Cobalt (Co), Copper (Cu), Chromium (Cr), Manganese (Mn) - Two-circle goniometer with vertical theta-theta geometry - PreFIX modules for optics and sample stages - CMOS pixel area detector - Analytical software for phase identification, residual stress, micro-diffraction, and crystal orientation analysis - Accessories and Consumables: - Copper, Cobalt, Chromium, and Manganese long fine focus X-ray tubes - External air-cooled chiller unit - Copper attenuation foils (0.1 mm and 0.2 mm) - Pressed silicon powder sample - Rolled copper specimen - Thin film sample (glass plate with chromium film) - Services Requested: - On-site installation, Factory Acceptance Test (FAT), and System Acceptance Test (SAT) - Initial on-site training (minimum one day) - Application training (minimum three days, within three months of SAT) - Unique/Notable Requirements: - System must support advanced aerospace materials analysis (phase identification, residual stress, micro-diffraction, single crystal orientation) - Multiple X-ray tube compatibility and advanced detector/goniometer features - Comprehensive analytical software - Safety features, on-site warranty, and specialized accessories for alignment and verification - Installation, verification, calibration, and training included - No specific OEMs or vendors are named in the solicitation or attachments.

Description

Please see attached Statement of Work for the Multi-purpose X-ray Diffraction (XRD) System. 

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