Queen's University Bonfire #Q-2026-020-WT

Queen's University Solicitation for FIB-SEM System

Queen's University is seeking to acquire a Focused-Ion Beam/Scanning Electron Microscope (FIB-SEM) System for advanced materials research. - Government Buyer: - Queen's University (Procurement Office) - Products/Services Requested: - Focused-Ion Beam/Scanning Electron Microscope (FIB-SEM) System - Must support: - Preparation of ultra-thin foils for transmission electron microscopy (TEM) - Final stage thinning at cryogenic temperatures - Ambient condition milling for small-scale mechanical testing (e.g., cantilever beams, micropillars) - 3D microstructural analysis - No specific part numbers or quantities provided - OEMs and Vendors: - No specific OEMs or vendors named; equivalent or better systems may be proposed - Unique/Notable Requirements: - Instrument must be general-purpose and support both cryogenic and ambient operations - Proposals must include a submission form, rate bid form, references, and a written proposal - Bidders may propose equivalent or superior solutions

Description

This Request for Proposals (RFP) issued by Queen's University invites prospective proponents to submit proposals for a Focused-Ion Beam/Scanning Electron Microscope (FIB-SEM) System. The instrument will be a general-purpose tool capable of preparing ultra-thin foils for transmission electron microscopy (TEM), including final stage thinning at cryogenic temperature, ambient condition milling for small scale mechanical testing, and 3D microstructural analysis. The procurement includes submission of various required documents such as submission form, rate bid form, references, and a written proposal. Bidders can obtain bid documents from www.biddingo.com.

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