SAM #AMDTCNOI2601459

NIST Sole Source Procurement: Highly Accelerated Stress Test (HAST) System for Semiconductor Reliability

NIST's Engineering Laboratory Division 735 is seeking to procure a Highly Accelerated Stress Test (HAST) System for reliability testing in semiconductor packaging defect characterization, supporting the CHIPS Metrology program. - Sole source procurement is planned for ESPEC North America, Inc., unless alternate sources are identified - One HAST System is required, with detailed technical specifications: - Single cylindrical vessel, minimum 21 liters interior volume, max weight 200 kg - Multiple control modes (unsaturated, wet-saturated, dry-wet bulbs) - Touch-screen controller with temperature, humidity, and countdown display - Ethernet interface, remote monitoring and control - Water supply tank, two stainless steel shelves, status indicator light, emergency stop switch - Vessel must accommodate at least one 200 mm wafer - Stainless steel construction, operation temperature 105°C to 162°C, humidity 75-100% RH, pressure 0.020 to 0.392 MPa - Automatic water supply, bias pins with 12 terminals - Safety features: overcurrent, overheat, overpressure protection, door lock safety, calibration certificate - Delivery required within eight weeks after receipt of order - Place of performance is Building 220, Gaithersburg, MD (NIST campus) - No set-aside for any business category; opportunity referenced as AMDTCNOI2601459

Description

See attached combined sources sought notice / notice of intent to sole source. 

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