SAM #1333ND26PNB030039

Award for Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) to FEI Company

This award notice announces the selection of FEI Company to provide a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) for the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland. - Government Buyer: - Department of Commerce - National Institute of Standards and Technology (NIST) - Acquisition Management Division - OEM/Vendor: - FEI Company (highlighted as the manufacturer and supplier) - Product Requested: - Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) - No specific part number or quantity detailed - Award Value: - $4,486,721.00 - Place of Performance: - NIST, Gaithersburg, MD - No unique technical requirements or additional services are specified in the provided information.

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