Award
CanadaBuys #1034199
Cold Field Emission Scanning Electron Microscope
Recipient
Hitachi High-Tech Canada Inc.
Award Amount
$986,690.74
Ceiling
$986,690.74
Awarded
July 29, 2026
Identifier
1034199
Award for supply and installation of an ultra-high resolution Cold Field Emission Scanning Electron Microscope to Hitachi High-Tech Canada Inc. by the National Research Council of Canada.
Description
The Construction Research Center of the National Research Council of Canada has a requirement for the supply and installation of one ultra-high resolution Cold Field Emission Scanning Electron Microscope, which must have a Cold Field Emission (CFE) gun consisting of a single tungsten crystal with an anode heating system allowing ultra-high resolution ultra-bright imaging. The Contractor must install the CFE-Scanning Electron Microscope (SEM) and ensure that the installed CFE-SEM with required features is correctly adjusted, calibrated, and serviced such that the equipment is ready for operational use.