Minnesota FOIA #W530672717

Development of CMP-slurry particle evaluation analysis method to measure large particles (larger than 500nm) that cau...

This purchase order from TWIN_CITIES to SEOUL NATIONAL UNIVERSITY OF SCIENCE AND involves a $30,000 contract for the development of a CMP-slurry particle evaluation analysis method aimed at measuring large particles (>500nm) that cause semiconductor defects. The award was made on November 26, 2024, and the vendor is located in Nowon-gu, Seoul, South Korea. The contract appears to be a single-transaction procurement with no specified multi-year or blanket arrangement. The project focuses on semiconductor manufacturing quality control, with no specific mention of additional OEMs or vendors, and no notable contract requirements beyond the development of the analysis method.

Description

Development of CMP-slurry particle evaluation analysis method to measure large particles (larger than 500nm) that cause semiconductor defects